Template:Featured Image/November, 2013
From CSU-CHILL
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Reflectivity brightband Small scale reflectivity features are evident in an RHI scan done with the narrow (0.3 deg) beamwidth CSU-CHILL X-band system. Photo credit: Pat Kennedy |
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Reflectivity brightband Small scale reflectivity features are evident in an RHI scan done with the narrow (0.3 deg) beamwidth CSU-CHILL X-band system. Photo credit: Pat Kennedy |
